biblio.bib

@Article{Hunter:2007,
  Author    = {Hunter, J. D.},
  Title     = {{Matplotlib: A 2D Graphics Environment}},
  Journal   = {Computing in Science \& Engineering},
  Volume    = {9},
  Number    = {3},
  Pages     = {90--95},
  abstract  = {Matplotlib is a 2D graphics package used for Python for
  application development, interactive scripting, and publication-quality
  image generation across user interfaces and operating systems.},
  publisher = {IEEE COMPUTER SOC},
  doi       = {10.1109/MCSE.2007.55},
  year      = 2007
}

@article{bauer1974,
  title = {De-{{Embedding}} and {{Unterminating}}},
  author = {Bauer, R.F. and Penfield, P.},
  date = {1974-03},
  year = {1974},
  journal = IEEE_J_MTT,
  volume = {22},
  pages = {282--288},
  issn = {1557-9670},
  doi = {10/d789vg},
  abstract = {De-embedding is the process of deducing the impedance of a device under test from measurernents made at a distance, when the electrical properties of the intervening structure are known. Unterminating is the process of deducing the electrical properties of the intervening structure from a series of measurements with known embedded devices. The mathematical steps necessary for de-embedding and unterminating with theoretically redundant measurements in order to minimize the effect of experimental errors.},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {Diodes,Frequency domain analysis,Frequency measurement,Impedance measurement,Laboratories,Microwave devices,Microwave measurements,Microwave theory and techniques,Reflection,Testing},
  number = {3}
}

@article{bennett1978,
  title = {{Time-Domain Electromagnetics and Its Applications}},
  author = {Bennett, C.L. and Ross, G.F.},
  date = {1978-03},
  year = {1978},
  journal = IEEE_J_PROC,
  volume = {66},
  pages = {299--318},
  issn = {1558-2256},
  doi = {10/fv6z6k},
  abstract = {The purpose of this paper is to introduce the reader to the elments of time-domain electromagnetics, which includes baseband-pulse technology and target-signature analysis. Baseband pulses are video or carrierless pulses of very short duration, whose spectral content is concentrated primarily from zero frequency through the microwave region of the spectrum. Work in baseband technology began more than ten years ago at the Sperry Research Center with emphasis primarily on its use as an analytical tool, initially to explore the properties of microwave networks [1], and subsequently to determine the intrinsic properties of materials [2]. The experimental phases of these studies were aided by the pioneering development by the Hewlett-Packard Company of their sampling oscilloscope [3]. These techniques were further extended to experimentally analyze and synthesize antenna radiating and receiving elements [4], [5]. Success in the antenna area led to the development of an indoor ground-plane scattering range to measure the impulse properties of targets or obstacles [6]. This type of range obviated the need for an expensive anechoic chamber since time-gating techniques permitted unwanted reflections from the walls and ceilings to be easily eliminated. A sampling oscillosope and an instrumentation computer were used to process target-signature data as a function of illumination angle. At about the same time, analytical techniques were developed which permitted target-signature analysis to be carried out efficiently and accurately in the time domain [7]. Applications where threshold rather than target-signature data is sufficient were also investigated, and for these applications it became clear that because of cost, the sampling oscilloscope had to be replaced by a stable and fast-acting threshold device. To meet this requirement, two different types of tunnel-diode receivers were developed. The successful developmemt of these receivers, together with the design of inexpensive microwave delay-line ranging techniques, led to the evolution of BAseband Radar (BAR) or free-space time-domain reflectometry. BAR devices have been designed and recently demonstrated for various applications, including auto precollision sensing, spaceship docking, airport surface-traffic control, auto braking, tanker-ship docking, harborcollision avoidance, etc. These sensing applications cover ranges from 5 to 5000 ft [8]. In other applications, the development of high-speed subnanosecond logic has impacted the computer field, making higher speed computation possible. Further developments resulted in the construction of a subnanosecond, single coaxial cable scheme for multiplexing data between computer terminals [9]. More recently, baseband-pulse techniques have been applied to the problem of developing a short-range wireless communication link. Here, the low EM pollution and covertness of operation potentially provide the means for wireless transmission without licensing. We review the research areas described above in more detail and refer the reader to references and a comprehensive biblography where sources for detailed information can be found [10].},
  eventtitle = {Proceedings of the {{IEEE}}},
  keywords = {Application software,Baseband,Electromagnetic analysis,Frequency,Microwave technology,Network synthesis,Oscilloscopes,Receiving antennas,Sampling methods,Time domain analysis},
  number = {3}
}

@article{cronson1973,
  title = {Time-{{Domain Measurements}} of {{Microwave Components}}},
  author = {Cronson, Harry M. and Mitchell, Peter G.},
  date = {1973-12},
  year = {1973},
  journal = IEEE_J_IM,
  volume = {22},
  pages = {320--325},
  issn = {1557-9662},
  doi = {10/dhr96h},
  abstract = {Recent advances in microwave component measurements using time-domain techniques are described. After reviewing the basic elements of a time-domain system, a substitution procedure is applied to determine the insertion loss of wide-band attenuators. Comparison of these measurements with frequency calibrations shows agreement to within 0.1 dB in 10 dB for attenuators between 10-50 dB, over the frequency range 0.4-8 GHz. Error sources are resolved by experiments designed to isolate and evaluate various contributions including: random errors due to noise and drifts; systematic errors caused by substitution attenuator inaccuracies, line mismatch, deflection nonlinearities, and inaccurate time window widths; time-to-frequency translation errors of aliasing and truncation; and mechanical errors due to connect-disconnect cycles. Results show that random processes are responsible for most of the observed error. The reported measurements establish the calibration capabilities and the expected magnitude of individual system errors for the particular system tested.},
  eventtitle = {{{IEEE Transactions}} on {{Instrumentation}} and {{Measurement}}},
  keywords = {Attenuation measurement,Attenuators,Calibration,Frequency measurement,Insertion loss,Microwave measurements,Microwave theory and techniques,Random processes,Time domain analysis,Wideband},
  number = {4}
}

@inproceedings{davidson1990,
  title = {{{LRM}} and {{LRRM Calibrations}} with {{Automatic Determination}} of {{Load Inductance}}},
  booktitle = {Proc. 36th {{ARFTG Conf. Digest}}},
  author = {Davidson, Andrew and Jones, Keith and Strid, Eric},
  date = {1990-11},
  year = {1990},
  volume = {18},
  pages = {57--63},
  doi = {10/cwqj2b},
  abstract = {Two new techniques are presented in an effort to achieve greater accuracy and better repeatability in the on-wafer calibration of vector network analyzers. The first is a method of determining an inductance value for the match standard during the calibration process so that only its resistance, not its reactance, needs to be known. The second is a new type of calibration, LRRM (line-reflect-reflect-match), which is a variation of LRM with several possible advantages. Also, a simple series resistance-inductance model for a coplanar load is experimentally investigated to 40 GHz and found to provide a good description of the load behavior.},
  eventtitle = {36th {{ARFTG Conference Digest}}},
  keywords = {Calibration,Capacitance,Electric resistance,Electrical resistance measurement,Frequency,Geometry,Impedance,Inductance,Probes,Resistors}
}

@article{engen1979,
  title = {Thru-{{Reflect}}-{{Line}}: {{An Improved Technique}} for {{Calibrating}} the {{Dual Six}}-{{Port Automatic Network Analyzer}}},
  shorttitle = {Thru-{{Reflect}}-{{Line}}},
  author = {Engen, G.F. and Hoer, C.A.},
  date = {1979-12},
  year = {1979},
  journal = IEEE_J_MTT,
  volume = {27},
  pages = {987--993},
  issn = {0018-9480},
  doi = {10/bh75qh},
  url = {http://ieeexplore.ieee.org/document/1129778/},
  urldate = {2019-11-19},
  keywords = {\#nosource},
  langid = {english},
  number = {12}
}

@article{ferrero1992,
  title = {{Two-Port Network Analyzer Calibration Using an Unknown 'Thru'}},
  author = {Ferrero, A. and Pisani, U.},
  date = {1992-12},
  year = {1992},
  journal = IEEE_J_MGWL,
  volume = {2},
  pages = {505--507},
  issn = {1558-2329},
  doi = {10/dcpqb5},
  abstract = {A procedure performed by using a genuine two-port reciprocal network instead of a standard 'thru' in a full two-port error correction of an automatic network analyzer is presented. Although it can be applied to any type of waveguide system, the proposed technique is particularly useful with noninsertable coaxial or one-wafer devices. Experimental comparisons show that the suggested procedure provides a great degree of accuracy.{$<>$}},
  eventtitle = {{{IEEE Microwave}} and {{Guided Wave Letters}}},
  keywords = {Calibration,Coaxial components,Connectors,Error correction,Measurement standards,Performance analysis,Scattering parameters,Testing,Transmission line matrix methods,Waveguide components},
  number = {12}
}

@article{granger2021,
  title = {Jupyter: {{Thinking}} and {{Storytelling With Code}} and {{Data}}},
  shorttitle = {Jupyter},
  author = {Granger, B. E. and Pérez, F.},
  date = {2021-03},
  year = {2021},
  journal = {Computing in Science Engineering},
  volume = {23},
  pages = {7--14},
  issn = {1558-366X},
  doi = {10/gjkwx2},
  abstract = {Project Jupyter is an open-source project for interactive computing widely used in data science, machine learning, and scientific computing. We argue that even though Jupyter helps users perform complex, technical work, Jupyter itself solves problems that are fundamentally human in nature. Namely, Jupyter helps humans to think and tell stories with code and data. We illustrate this by describing three dimensions of Jupyter: 1) interactive computing; 2) computational narratives; and 3) the idea that Jupyter is more than software. We illustrate the impact of these dimensions on a community of practice in earth and climate science.},
  eventtitle = {Computing in {{Science Engineering}}},
  keywords = {Data science,Machine learning,Meteorology,Open source software,Scientific computing},
  number = {2}
}

@article{hallbjorner2003,
  title = {{Method for Calculating the Scattering Matrix of Arbitrary Microwave Networks Giving Both Internal and External Scattering}},
  author = {Hallbjörner, Paul},
  date = {2003-07-20},
  year = {2003},
  journal = {Microw. Opt. Technol. Lett.},
  volume = {38},
  pages = {99--102},
  issn = {08952477},
  doi = {10/d27t7m},
  url = {http://doi.wiley.com/10.1002/mop.10983},
  urldate = {2019-11-19},
  langid = {english},
  number = {2}
}

@article{harris2020,
  title = {{Array Programming with NumPy}},
  author = {Harris, Charles R. and Millman, K. Jarrod and van der Walt, Stéfan J. and Gommers, Ralf and Virtanen, Pauli and Cournapeau, David and Wieser, Eric and Taylor, Julian and Berg, Sebastian and Smith, Nathaniel J. and Kern, Robert and Picus, Matti and Hoyer, Stephan and van Kerkwijk, Marten H. and Brett, Matthew and Haldane, Allan and del Río, Jaime Fernández and Wiebe, Mark and Peterson, Pearu and Gérard-Marchant, Pierre and Sheppard, Kevin and Reddy, Tyler and Weckesser, Warren and Abbasi, Hameer and Gohlke, Christoph and Oliphant, Travis E.},
  date = {2020-09},
  year = {2020},
  journal = {Nature},
  volume = {585},
  pages = {357--362},
  publisher = {{Nature Publishing Group}},
  issn = {1476-4687},
  doi = {10/ghbzf2},
  url = {https://www.nature.com/articles/s41586-020-2649-2},
  urldate = {2020-09-21},
  abstract = {Array programming provides a powerful, compact and expressive syntax for accessing, manipulating and operating on data in vectors, matrices and higher-dimensional arrays. NumPy is the primary array programming library for the Python language. It has an essential role in research analysis pipelines in fields as diverse as physics, chemistry, astronomy, geoscience, biology, psychology, materials science, engineering, finance and economics. For example, in astronomy, NumPy was an important part of the software stack used in the discovery of gravitational waves1 and in the first imaging of a black hole2. Here we review how a few fundamental array concepts lead to a simple and powerful programming paradigm for organizing, exploring and analysing scientific data. NumPy is the foundation upon which the scientific Python ecosystem is constructed. It is so pervasive that several projects, targeting audiences with specialized needs, have developed their own NumPy-like interfaces and array objects. Owing to its central position in the ecosystem, NumPy increasingly acts as an interoperability layer between such array computation libraries and, together with its application programming interface (API), provides a flexible framework to support the next decade of scientific and industrial analysis.},
  issue = {7825},
  langid = {english},
  number = {7825},
  options = {useprefix=true}
}

@inproceedings{hietala1999,
  title = {{Determining Two-Port {{S}}-Parameters from a One-Port Measurement Using a Novel Impedance-State Test Chip}},
  booktitle = {Proc. 1999 IEEE MTT-S Int. Microw. Symp. Dig.},
  author = {Hietala, V.M.},
  date = {1999-06},
  year = {1999},
  volume = {4},
  pages = {1639-1642},
  doi = {10/ckqvq6},
  abstract = {A novel custom high-speed test chip and data reduction technique that allows for the accurate determination of the two-port S-parameters of a passive network from a set of one-port measurements is presented. A typical application for this technique is high-speed integrated circuit package characterization where one-port is of a microelectronic size scale and inside the package. The test chip is designed to operate up to 20 GHz.},
  eventtitle = {1999 {{IEEE MTT}}-{{S International Microwave Symposium Digest}} ({{Cat}}. {{No}}.{{99CH36282}})},
  keywords = {Bonding,Impedance measurement,Measurement standards,Measurement techniques,Packaging,Radio frequency,Reflection,Scattering parameters,Switches,Testing}
}

@article{kruppa1971,
  title = {{An Explicit Solution for the Scattering Parameters of a Linear Two-Port Measured with an Imperfect Test Set (Correspondence)}},
  author = {Kruppa, W. and Sodomsky, K.F.},
  date = {1971-01},
  year = {1971},
  journal = IEEE_J_MTT,
  volume = {19},
  pages = {122--123},
  issn = {1557-9670},
  doi = {10/dhzbd9},
  abstract = {FormuIas are derived for the direct calculation of the scattering parameters of a linear two-port, using measurements made on a test set having residual, tracking, and mistermination errors. The problem is formulated by representing the measuring system in terms of scattering parameters. Solutions using this formulation have previously been obtained only in an implicit manner using an iterative approach. The associated calibration procedure is included.},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {Calibration,Computer errors,Equations,Impedance measurement,Iterative methods,Measurement standards,Performance evaluation,Radio frequency,Scattering parameters,Testing},
  number = {1}
}

@article{liu2006,
  title = {{A Reflectometer Calibration Method Resistant to Waveguide Flange Misalignment}},
  author = {Liu, Zhiyang and Weikle, R.M.},
  date = {2006-06},
  year = {2006},
  journal = IEEE_J_MTT,
  volume = {54},
  pages = {2447--2452},
  issn = {1557-9670},
  doi = {10/cc596s},
  abstract = {A new reflectometer calibration method is described that utilizes four standards: a flush short, two delay shorts with unspecified but different phases, and an open-ended waveguide. The calibration method eliminates the requirement for a precision waveguide matched load, which can be problematic to realize at submillimeter wavelengths. Importantly, it is shown that the technique is resistant to waveguide flange misalignment, which is among the most serious factors that degrade the calibration accuracy of vector network analyzers operating above 100 GHz. Scaled measurements using this method have been performed in the W-band (75-110 GHz) where it is readily compared to other calibration methods such as thru reflect line to assess its utility and performance. Measurement results demonstrate the robustness of this new calibration method and have verified it is superior to the commonly utilized short/delayed-short/load technique with respect to the influence of waveguide flange misalignment},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {Calibration,Degradation,Flanges,Loaded waveguides,Machining,Millimeter wave measurements,Optical device fabrication,Propagation delay,Submillimeter wave technology,submillimeter-wave measurements,Testing,waveguides},
  number = {6}
}

@article{marks1991,
  title = {{A Multiline Method of Network Analyzer Calibration}},
  author = {Marks, R.B.},
  date = {1991-07},
  year = {1991},
  journal = IEEE_J_MTT,
  volume = {39},
  pages = {1205--1215},
  issn = {1557-9670},
  doi = {10/c947xj},
  abstract = {The author presents a method for the calibration of network analyzers. The essential feature is the use of multiple, redundant transmission line standards. The additional information provided by the redundant standards is used to minimize the effects of random errors, such as those caused by imperfect connector repeatability. The resulting method exhibits improvements in both accuracy and bandwidth over conventional methods. The basis of the statistical treatment is a linearized error analysis of the TRL (thru-reflect-line) calibration method. The analysis presented is useful in the assessment of calibration accuracy. It also yields results relevant to the choice of standards.{$<>$}},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {accuracy,assessment of calibration accuracy,bandwidth,Bandwidth,calibration,Calibration,calibration of network analyzers,Connectors,Covariance matrix,Error analysis,Frequency,imperfect connector repeatability,Iterative methods,linearized error analysis,microwave measurement,multiline method of network analyzer calibration,multiple transmission line standards,network analysers,random errors reduction,redundant transmission line standards,statistical treatment,thru-reflect-line calibration method,Transmission line matrix methods,Transmission line theory,Transmission lines,TRL method},
  number = {7}
}

@inproceedings{marks1997,
  title = {{Formulations of the Basic Vector Network Analyzer Error Model Including Switch-Terms}},
  booktitle = {{Proc. 50th ARFTG Conf. Dig.}},
  author = {Marks, Roger B.},
  date = {1997-12},
  year = {1997},
  volume = {32},
  pages = {115--126},
  doi = {10/fc7vnx},
  abstract = {This paper explores details of the relationship between two expressions of the basic error model describing a two-port vector network analyzer (VNA). One of these formulations is the conventional twelve-term formulation; the other is in terms of error boxes. The paper focuses on the role of the switch terms. By fully detailing the relationship between the two formulations, the paper arrives at several significant new results, including an explicit constraint on the parameters of the twelve-term model.},
  eventtitle = {50th {{ARFTG Conference Digest}}},
  keywords = {Cables,Calibration,Computer architecture,Computer errors,Computer networks,Error analysis,Impedance measurement,Scattering parameters,Switches,Testing}
}

@inproceedings{ou2005,
  title = {{Determine Two-Port {{S}}-Parameters from One-Port Measurements Using Calibration Substrate Standards}},
  booktitle = {Proc. 2005 Electron. Compon. and Techn. (ECTC)},
  author = {Ou, J. and Caggiano, M.F.},
  date = {2005-05},
  year = {2005},
  pages = {1765-1768 Vol. 2},
  issn = {2377-5726},
  doi = {10/czwqwj},
  abstract = {A technique for determining two port S-parameters from one port measurements using calibration substrate standards is described in this paper. Closed form formulas are derived to facilitate conversion from one port reflection measurements to two-port S-parameters. Comparisons are made to previously reported techniques. It is observed that the two-port S-parameters generated using SOL method is free of artificial ripples typically observed in two port S-parameters generated by the SO and the cascade methods.},
  eventtitle = {Proceedings {{Electronic Components}} and {{Technology}}, 2005. {{ECTC}} '05.},
  keywords = {Calibration,Electric variables measurement,Impedance measurement,Lifting equipment,Measurement standards,Reflection,Scattering parameters,Semiconductor device measurement,Transmission line matrix methods,Vectors}
}

@article{perez2007,
  title = {{IPython: A System for Interactive Scientific Computing}},
  shorttitle = {{{IPython}}},
  author = {Perez, Fernando and Granger, Brian E.},
  date = {2007-05},
  year = {2007},
  journal = {Computing in Science Engineering},
  volume = {9},
  pages = {21--29},
  issn = {1558-366X},
  doi = {10/dcs6r3},
  abstract = {Python offers basic facilities for interactive work and a comprehensive library on top of which more sophisticated systems can be built. The IPython project provides on enhanced interactive environment that includes, among other features, support for data visualization and facilities for distributed and parallel computation},
  eventtitle = {Computing in {{Science Engineering}}},
  keywords = {computer languages,Data analysis,Data visualization,Hardware,Libraries,Parallel processing,Production,Python,scientific computing,Scientific computing,scientific programming,Spine,Supercomputers,Testing},
  number = {3}
}

@article{rehnmark1974,
  title = {{On the Calibration Process of Automatic Network Analyzer Systems (Short Papers)}},
  author = {Rehnmark, S.},
  date = {1974-04},
  year = {1974},
  journal = IEEE_J_MTT,
  volume = {22},
  pages = {457--458},
  issn = {1557-9670},
  doi = {10/fqxwdg},
  abstract = {Formulas are presented for the direct calculation of the scattering parameters of a linear two-port, when it is measured by an imperfect network analyzer. Depending on the hardware configuration of the test set, the measurement system is represented by one of two flowgraph models. In both models presented, leakage paths are included. The error parameters, i.e., the scattering parameters of the measuring system, are six respective ten complex numbers for each frequency of interest. A calibration procedure, where measurements are made on standards, will determine the error parameters. One of many possible calibration procedures is briefly described. By using explicit formulas instead of iterative methods, the computing time for the correction of the scattering parameters of the unknown two-port is significantly reduced. The addition of leakage paths will only have a minor effect on computational complexity while measurement accuracy will increase.},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {Calibration,Electromagnetic analysis,EMP radiation effects,Hardware,Measurement standards,Scattering parameters,Switches,System testing,Transmission line theory},
  number = {4}
}

@article{silvonen1993,
  title = {{Calibration of 16-Term Error Model}},
  author = {Silvonen, K. J.},
  date = {1993-08-19},
  year = {1993},
  journal = {Electronics Letters},
  volume = {29},
  pages = {1544--1545},
  publisher = {{IET Digital Library}},
  issn = {1350-911X},
  doi = {10/chnnvz},
  url = {https://digital-library.theiet.org/content/journals/10.1049/el_19931029},
  urldate = {2021-06-29},
  abstract = {Based on numerical simulations it is pointed out that five calibration measurements are needed to exactly calibrate the 16-parameter error model (for measurements of microwave circuits). Possible combinations of calibration standards are studied. The nonsingular combinations are listed in a Table.},
  langid = {english},
  number = {17}
}

@article{speciale1977,
  title = {{A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors}},
  author = {Speciale, R.A.},
  date = {1977-12},
  year = {1977},
  journal = IEEE_J_MTT,
  volume = {25},
  pages = {1100--1115},
  issn = {1557-9670},
  doi = {10/cwcf96},
  abstract = {The basic philosophy of the through-short-delay (TSD) calibration procedure for two-port automated network analyzers has been extended to n-port scattering-parameter measurements, while also accounting for the errors due to possible signal leakage between all port pairs. The system errors are represented by the scattering response of a 2n-port virtual error network, having n ports connected to the device under test and n ports connected to an ideal error-free multiport network analyzer. The (2n)/sup 2/ T-parameters of the error network are explicitly expressed in blocks of n/sup 2/ at a time, as matricial functions of the 3n/sup 2/ S-parameters of three n-port standards, sequentially replacing the device under test during system calibration. The possibility has also been investigated of correcting the errors due to repeatable measurement-port mismatch changes, typical of switching scattering-parameter test sets. This capability has been introduced and tested in the classical two-port TSD calibration algorithm, by means of a minor modification and data postprocessing, applied after the removal of conventional errors.},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {Calibration,Error analysis,Error correction,Measurement standards,Performance evaluation,Reflection,Scattering parameters,Semiconductor device measurement,Signal analysis,System testing},
  number = {12}
}

@article{williams2013,
  ids = {williams2013-1},
  title = {{Traveling Waves and Power Waves: Building a Solid Foundation for Microwave Circuit Theory}},
  shorttitle = {Traveling {{Waves}} and {{Power Waves}}},
  author = {Williams, Dylan},
  date = {2013-11},
  journal = IEEE_M_MW,
  year = {2013},
  volume = {14},
  pages = {38--45},
  issn = {1527-3342},
  doi = {10.1109/MMM.2013.2279494},
  url = {http://ieeexplore.ieee.org/document/6668983/},
  urldate = {2019-11-19},
  keywords = {electromagnetic field solutions,electromagnetic field theory,Electromagnetic measurements,equivalent circuits,Equivalent circuits,History,lossy printed transmission lines,Maxwell equations,microwave circuits,Microwave circuits,microwave electronics,microwave equivalent-circuit theory,Microwave measurement,Power transmission lines,power waves,solid foundation,Transmission line measurements,transmission lines,Traveling wave tubes,traveling waves},
  langid = {english},
  number = {7}
}

@article{young1998,
  title = {{Wide-Band 2N-Port S-Parameter Extraction from N-Port Data}},
  author = {Young, B.},
  date = {1998-09},
  year = {1998},
  journal = IEEE_J_MTT,
  volume = {46},
  pages = {1324--1327},
  issn = {1557-9670},
  doi = {10/dkm7x6},
  abstract = {A technique is presented for extracting the full 2N/spl times/2N set of S-parameters for an N-conductor interconnect from five sets of N-port S-parameter measurements on three specially prepared samples. Bandwidth is improved over prior techniques using two samples. Experiments confirm the bandwidth enhancement and illustrate the operational mechanism and accuracy expectations.},
  eventtitle = {{{IEEE Transactions}} on {{Microwave Theory}} and {{Techniques}}},
  keywords = {Bandwidth,Data mining,Equations,Frequency measurement,Impedance measurement,Jacobian matrices,Scattering parameters,Wideband},
  number = {9}
}

@ARTICLE{vectfit,  
    author={Gustavsen, B. and Semlyen, A.},  
    journal=IEEE_J_PWRD,   
    title={{Rational Approximation of Frequency Domain Responses by Vector Fitting}},   
    year={1999},  
    volume={14},  
    number={3},  
    pages={1052-1061},  
    doi={10.1109/61.772353}
}

@ARTICLE{vectfit_improved,  
    author={Gustavsen, B.},  
    journal=IEEE_J_PWRD,   
    title={{Improving the Pole Relocating Properties of Vector Fitting}},   
    year={2006},  
    volume={21},  
    number={3},  
    pages={1587-1592},  
    doi={10.1109/TPWRD.2005.860281}
}

@ARTICLE{vectfit_fast,  
    author={Deschrijver, Dirk and Mrozowski, Michal and Dhaene, Tom and De Zutter, Daniel},  
    journal=IEEE_J_MWCL,   
    title={{Macromodeling of Multiport Systems Using a Fast Implementation of the Vector Fitting Method}},   
    year={2008},  
    volume={18},  
    number={6},  
    pages={383-385},  
    doi={10.1109/LMWC.2008.922585}
}

@ARTICLE{vectfit_spice,  
    author={Antonini, G.},  
    journal=IEEE_J_EMC,   
    title={{SPICE Equivalent Circuits of Frequency-Domain Responses}},   
    year={2003},  
    volume={45},  
    number={3},  
    pages={502-512},  
    doi={10.1109/TEMC.2003.815528}
}

@misc{ngspice_website,
  title = {{Website of the ngspice project}},
  howpublished = "\url{http://ngspice.sourceforge.net/}",
  note = "[Online]"
}