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Analog Filamentary Conductive-Metal-Oxide (CMO)/HfOx ReRAM device noise model for inference #702

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Description

A new noise model for inference assessment has been included in the ReRAM noise models, in addition to the statistical noise model from Wang 2022 (Nature). The presented model is inferred from novel Analog AFilamentary CMO/HfOx ReRAM devices.

The noise model accounts for the following effects from experimental characterization:

  • Programming noise: considered for two different acceptance ranges of the program-and-verify scheme.
  • Conductance drift: G-independent conductance relaxation. The drift on the mean and standard deviation of the programmed conductance only depends on the time of inference as a logarithmic function.

@soykilian soykilian force-pushed the mvc branch 2 times, most recently from 6ae30a7 to 9da8b32 Compare December 16, 2024 14:02
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@PabloCarmona PabloCarmona left a comment

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Thank you very much for your addition @soykilian!!! Please review the comments and address the changes requested. Also can you please add an example in the examples folder about an application of use for this case?

Again thanks for your effort and contribution to the project! :)

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src/aihwkit/inference/converter/conductance.py Outdated Show resolved Hide resolved
src/aihwkit/inference/converter/conductance.py Outdated Show resolved Hide resolved
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src/aihwkit/inference/noise/reram.py Outdated Show resolved Hide resolved
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Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
Signed-off-by: soykilian <[email protected]>
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2 participants